1. Report Overview
1.1. Report Description
1.2. Research Methods
1.3. Research Approaches
2. Executive Summary
3. Market Overview
3.1. Introduction
3.2. Market Dynamics
3.2.1. Drivers
3.2.2. Restraints
3.2.3. Opportunities
3.2.4. Challenges
3.3. PEST-Analysis
3.4. Porter's Diamond Model for United Kingdom Semiconductor Metrology and Inspection Equipment Market
3.5. IGR-Growth Matrix Analysis
3.6. Value Chain Analysis of United Kingdom Semiconductor Metrology and Inspection Equipment Market
3.7. Competitive Landscape in United Kingdom Semiconductor Metrology and Inspection Equipment Market
4. The United Kingdom Semiconductor Metrology and Inspection Equipment Market by Technology
4.1. Inspection Equipment
4.1.1. Wafer Inspection
4.1.2. Defect Inspection
4.1.3. Mask / Photomask Inspection
4.1.4. Bump & Package Inspection
4.1.5. Others
4.2. Metrology Equipment
4.2.1. Critical Dimension (CD) Metrology
4.2.2. Thin Film Metrology
4.2.3. Overlay Metrology
4.2.4. Wafer Shape & Surface Metrology
4.2.5. Others
5. The United Kingdom Semiconductor Metrology and Inspection Equipment Market by Dimension
5.1. 2D Metrology / Inspection
5.2. 3D Metrology / Inspection
5.3. Hybrid 2D/3D Systems
6. The United Kingdom Semiconductor Metrology and Inspection Equipment Market by Process Node
6.1. ≤ 7 nm
6.2. 8-14 nm
6.3. 15-28 nm
6.4. 28 nm
7. The United Kingdom Semiconductor Metrology and Inspection Equipment Market by Fab Type
7.1. Foundry
7.2. Memory
7.3. Logic
7.4. Integrated Device Manufacturer (IDM)
8. Company Profiles
8.1. Company 1
8.2. Company 2
8.3. Company 3
8.4. Company 4
8.5. Company 5
1. Report Overview
1.1. Report Description
1.2. Research Methods
1.3. Research Approaches
2. Executive Summary
3. Market Overview
3.1. Introduction
3.2. Market Dynamics
3.2.1. Drivers
3.2.2. Restraints
3.2.3. Opportunities
3.2.4. Challenges
3.3. PEST-Analysis
3.4. Porter's Diamond Model for the United Kingdom Semiconductor Metrology and Inspection Equipment Market
3.5. IGR-Growth Matrix Analysis
3.6. Value Chain Analysis of the United Kingdom Semiconductor Metrology and Inspection Equipment Market
3.7. Competitive Landscape in the United Kingdom Semiconductor Metrology and Inspection Equipment Market
4. The United Kingdom Semiconductor Metrology and Inspection Equipment Market by Technology
4.1. Inspection Equipment
4.1.1. Wafer Inspection
4.1.2. Defect Inspection
4.1.3. Mask / Photomask Inspection
4.1.4. Bump & Package Inspection
4.1.5. Others
4.2. Metrology Equipment
4.2.1. Critical Dimension (CD) Metrology
4.2.2. Thin Film Metrology
4.2.3. Overlay Metrology
4.2.4. Wafer Shape & Surface Metrology
4.2.5. Others
5. The United Kingdom Semiconductor Metrology and Inspection Equipment Market by Dimension
5.1. 2D Metrology / Inspection
5.2. 3D Metrology / Inspection
5.3. Hybrid 2D/3D Systems
6. The United Kingdom Semiconductor Metrology and Inspection Equipment Market by Process Node
6.1. ≤ 7 nm
6.2. 8-14 nm
6.3. 15-28 nm
6.4. 28 nm
7. The United Kingdom Semiconductor Metrology and Inspection Equipment Market by Fab Type
7.1. Foundry
7.2. Memory
7.3. Logic
7.4. Integrated Device Manufacturer (IDM)
8. Company Profiles
8.1. Company 1
8.2. Company 2
8.3. Company 3
8.4. Company 4
8.5. Company 5