1. Report Overview
1.1. Report Description
1.2. Research Methods
1.3. Research Approaches
2. Executive Summary
3. Market Overview
3.1. Introduction
3.2. Market Dynamics
3.2.1. Drivers
3.2.2. Restraints
3.2.3. Opportunities
3.2.4. Challenges
3.3. PEST-Analysis
3.4. Porter's Diamond Model for Germany Semiconductor Metrology and Inspection Equipment Market
3.5. IGR-Growth Matrix Analysis
3.6. Value Chain Analysis of Germany Semiconductor Metrology and Inspection Equipment Market
3.7. Competitive Landscape in Germany Semiconductor Metrology and Inspection Equipment Market
4. Germany Semiconductor Metrology and Inspection Equipment Market by Technology
4.1. Inspection Equipment
4.1.1. Wafer Inspection
4.1.2. Defect Inspection
4.1.3. Mask / Photomask Inspection
4.1.4. Bump & Package Inspection
4.1.5. Others
4.2. Metrology Equipment
4.2.1. Critical Dimension (CD) Metrology
4.2.2. Thin Film Metrology
4.2.3. Overlay Metrology
4.2.4. Wafer Shape & Surface Metrology
4.2.5. Others
5. Germany Semiconductor Metrology and Inspection Equipment Market by Dimension
5.1. 2D Metrology / Inspection
5.2. 3D Metrology / Inspection
5.3. Hybrid 2D/3D Systems
6. Germany Semiconductor Metrology and Inspection Equipment Market by Process Node
6.1. ≤ 7 nm
6.2. 8-14 nm
6.3. 15-28 nm
6.4. 28 nm
7. Germany Semiconductor Metrology and Inspection Equipment Market by Fab Type
7.1. Foundry
7.2. Memory
7.3. Logic
7.4. Integrated Device Manufacturer (IDM)
8. Company Profiles
8.1. Company 1
8.2. Company 2
8.3. Company 3
8.4. Company 4
8.5. Company 5
1. Report Overview
1.1. Report Description
1.2. Research Methods
1.3. Research Approaches
2. Executive Summary
3. Market Overview
3.1. Introduction
3.2. Market Dynamics
3.2.1. Drivers
3.2.2. Restraints
3.2.3. Opportunities
3.2.4. Challenges
3.3. PEST-Analysis
3.4. Porter's Diamond Model for Germany Semiconductor Metrology and Inspection Equipment Market
3.5. IGR-Growth Matrix Analysis
3.6. Value Chain Analysis of Germany Semiconductor Metrology and Inspection Equipment Market
3.7. Competitive Landscape in Germany Semiconductor Metrology and Inspection Equipment Market
4. Germany Semiconductor Metrology and Inspection Equipment Market by Technology
4.1. Inspection Equipment
4.1.1. Wafer Inspection
4.1.2. Defect Inspection
4.1.3. Mask / Photomask Inspection
4.1.4. Bump & Package Inspection
4.1.5. Others
4.2. Metrology Equipment
4.2.1. Critical Dimension (CD) Metrology
4.2.2. Thin Film Metrology
4.2.3. Overlay Metrology
4.2.4. Wafer Shape & Surface Metrology
4.2.5. Others
5. Germany Semiconductor Metrology and Inspection Equipment Market by Dimension
5.1. 2D Metrology / Inspection
5.2. 3D Metrology / Inspection
5.3. Hybrid 2D/3D Systems
6. Germany Semiconductor Metrology and Inspection Equipment Market by Process Node
6.1. ≤ 7 nm
6.2. 8-14 nm
6.3. 15-28 nm
6.4. 28 nm
7. Germany Semiconductor Metrology and Inspection Equipment Market by Fab Type
7.1. Foundry
7.2. Memory
7.3. Logic
7.4. Integrated Device Manufacturer (IDM)
8. Company Profiles
8.1. Company 1
8.2. Company 2
8.3. Company 3
8.4. Company 4
8.5. Company 5