China Semiconductor Metrology and Inspection Equipment Market: Prospects, Trends Analysis, Market Size and Forecasts up to 2032

1.  Report Overview

1.1.  Report Description

1.2.  Research Methods

1.3.  Research Approaches

2.  Executive Summary

3.  Market Overview

3.1.  Introduction

3.2.  Market Dynamics

3.2.1.  Drivers

3.2.2.  Restraints

3.2.3.  Opportunities

3.2.4.  Challenges

3.3.  PEST-Analysis

3.4.  Porter's Diamond Model for China Semiconductor Metrology and Inspection Equipment Market

3.5.  IGR-Growth Matrix Analysis

3.6.  Value Chain Analysis of China Semiconductor Metrology and Inspection Equipment Market

3.7.  Competitive Landscape in China Semiconductor Metrology and Inspection Equipment Market

4.  China Semiconductor Metrology and Inspection Equipment Market by Technology

4.1.  Inspection Equipment

4.1.1.  Wafer Inspection

4.1.2.  Defect Inspection

4.1.3.  Mask / Photomask Inspection

4.1.4.  Bump & Package Inspection

4.1.5.  Others

4.2.  Metrology Equipment

4.2.1.  Critical Dimension (CD) Metrology

4.2.2.  Thin Film Metrology

4.2.3.  Overlay Metrology

4.2.4.  Wafer Shape & Surface Metrology

4.2.5.  Others

5.  China Semiconductor Metrology and Inspection Equipment Market by Dimension

5.1.  2D Metrology / Inspection

5.2.  3D Metrology / Inspection

5.3.  Hybrid 2D/3D Systems

6.  China Semiconductor Metrology and Inspection Equipment Market by Process Node

6.1.  ≤ 7 nm

6.2.  8-14 nm

6.3.  15-28 nm

6.4.  28 nm

7.  China Semiconductor Metrology and Inspection Equipment Market by Fab Type

7.1.  Foundry

7.2.  Memory

7.3.  Logic

7.4.  Integrated Device Manufacturer (IDM)

8.  Company Profiles

8.1.  Company 1

8.2.  Company 2

8.3.  Company 3

8.4.  Company 4

8.5.  Company 5